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30 wrz 2024 · Have a measurement challenge in mind? Leading manufacturer of in-line, in situ, and ex situ metrology tools for the semiconductor and thin-film industries. Custom non-contact measurements and software integration for production environments.
Exploit the power of RHEED with the kSA 400! The kSA 400 combines a high-resolution, high-speed, and high-sensitivity camera with sophisticated RHEED-specific acquisition and analysis software.
Modify k-space with a multitude of commonly used parameters on MRI scanners. See the effects on the reconstructed image immediately. For many students, the concept of k-space is a difficult topic of MR physics. Understanding can be facilitated by simple visualisation.
6 sty 2021 · K-Space has announced a new metrology tool called kSA Insight that allows researchers and operators to view their wafers and platen in real-time from within the K-Space software. The imaging system uses a high-resolution colour camera and is plug-and play compatible with all K-Space thin-film metrology software.
Full Carrier Temperature Maps at the Click of a Buton! The kSA ScanningPyro metrology tool is designed to quickly, easily, and accurately generate full wafer carrier temperature maps on Veeco K465i and EPIK 700 production MOCVD reactors.
